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Scanning Tunneling Microscope Page

                  The McAllister Scanning Tunneling Microscope (STM) is designed as an add-on to existing UHV surface analysis systems. It comes mounted on an 8-inch OD conflat flange with integral vibration isolation, viewport, electrical and mechanical feedthroughs, "wobble stick" tip changer and optical microscope. It even has a sample manipulator attachment which allows samples to be changed in the microscope without any additional transfer devices. Samples can be moved to and from the microscope using only the standard XYZ manipulator. All other feedthroughs are integral with the 8-inch flange. A simple load lock allows rapid specimen introduction.

Features:

 Software and Electronics:

 Versatility: Broad range of image manipulation routines:


Broad range of menu-selectable views:



Example data from various users:

Professor Kerry W. Hipps, Washington State University

Dr. Steve A. Joyce, Battelle Pacific Northwest Laboratories

Professor Dror Sarid, University of Arizona

Professor Ted Madey, Rutgers University


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Last Updated: 25 August 2000