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Scanning Tunneling Microscope PageThe McAllister Scanning Tunneling Microscope (STM) is designed as an add-on
to existing UHV surface analysis systems. It comes mounted on an 8-inch OD conflat flange with integral vibration isolation, viewport, electrical and mechanical feedthroughs, "wobble stick" tip changer and optical microscope. It even has a sample manipulator attachment which allows samples to be changed in the microscope without any additional transfer devices. Samples can be moved to and from the microscope using only the standard XYZ manipulator. All other feedthroughs are integral with the 8-inch flange. A simple load lock allows rapid specimen introduction.
Features:
Self-contained STM subsystem mounts on one 8-inch port in any ultra-high vacuum surface analysis system. All electrical, mechanical and optical feedthroughs are integral to this flange.
Sample transfer allows modular sample holder to be completely removed from STM for preparation or analysis. Sample is located on the flange centerline parallel to the flange. It is compatible with commercial UHV systems using "off-axis" manipulators.
Modular tip holder design allows exchange of tips in vacuum. Reserve tips are conveniently stored on the microscope base plate. Damage to even several tips does not interrupt or delay STM operation.
The STM base plate clamps rigidly in place for tip exchange, sample transfer and coarse tip positioning. Vibration isolation is achieved by simply unclamping the base plate.
Beryllium-copper coil springs above stacked plates provide integral vibration isolation. No magnets are needed, so there are no magnetic fields to interfere with other instruments such as electron spectrometers.
All piezo ceramic elements are field-replaceable in case of accidental mechanical or electrical damage.
An optional, externaly mounted, optical binocular microscope, mirror and UHV compatible fiber-optic light pipe allow viewing during coarse sample approach to the tip to within 1 µm.
Patented automatic tip/sample approach uses the "scooter" method and is manufactured under license from University of Illinois.
Optional sample sled for sample holders that are heated.
Software and Electronics:
The best technology at the best price
Versatility:Fully Digital 70 KHz Feedback Loop
Software control for true "crashless" tip/sample approach
Up to 6 separate image buffers may be displayed simultaneously for easy comparison
User-selectable filters including mean, median, low/high pass
Wide variety of scanner heads are supported
IBM-compatible Pentium computer
Analysis of frequencies in the signal to locate noise
Rigorous program debugging assures trouble-free software
Broad range of dot-matrix and laser printers supported
Instant screen dump to dot-matrix and laser printers
Software is not copy-protected
Free software upgrades for 2 years
Broad range of image manipulation routines:
Software allows using the computer as a digital oscilloscope for evaluation of tunneling parameters at a point, or for a row prior to full image acquisition
Current or topographic views of image data is available in all view models
Real time image display and parameter adjustment
Any graphics screen can be saved as a digital slide for "show & tell" presentations
Slide show presentation is automatic or manual
Use of mouse to select area for next image to scan
Rotation / zoom / cross section / mean & median filter
Slope correction
Image enhancement via Fast-Fourier Transform
Two dimensional FFT image editing
Broad range of menu-selectable views:
False color top view
256 false color display with color palette editor available in all display modesThree dimensional (3D): 3-D views include solid modeling with movable light source, wide frame and filled polygons with hidden line removal, rotation and tilt of viewpoint
I-V and I-Z spectroscopy
Schematics and Source Code
Complete electronic schematics are included with every unit.
Complete source code (C++) is also available.
Example data from various users:
Professor Kerry W. Hipps, Washington State University
Dr. Steve A. Joyce, Battelle Pacific Northwest Laboratories
Professor Dror Sarid, University of Arizona
Professor Ted Madey, Rutgers University
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Copyright © 1999 McAllister Technical Services. All rights reserved. Last Updated: 25 August 2000 |
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