Thin Film data

 A compact deposition system for ultrathin crystalline film growth,
R. E. Lake*, J. R. Puls, M. P. Ray and C. E. Sosolik

 Low temperature metal deposition processes for optoelectronic devices
Larry N. Lewis, Kevin H. Janora, Jie Liu, Shellie Gasaway, & Eric P. Jacobson
GE Global Research

Kelvin Probe data

 Kelvin Probe Measurements in Assembling Ionic Interfaces via Soft-Landed Ions,
A. A. Tsekouras, M. J. Iedema, J. P. Cowin, Pacific Northwest National Laboratory
G.B. Ellison, Department of Chemistry & Biochemistry, University of Colorado

 Changes in Work Function on Pt(111),
David Sauer and Eric M. Stuve, University of Washington

 Real-Time Work Function Change Measurements During Surface Reactions,
Michael X. Yang, Andrew V. Teplyakov, Phillip W. Kash and Brian E. Bent, Columbia University

 On the Elimination of Spacing Dependent Errors in the Kelvin Probe,
Van L. Eden and Robert C. McAllister, McAllister Technical Services

  A simple proceedure for adjusting the balance in the KP preamplifier.

 Scanning Tunneling Microscope data from various users:

 A Scanning Tunneling Microscopy and Spectroscopy Study of Vanadyl Phthalocyanine on Au(111)
D. Barlow and KW Hipps, Washing State University

 Surface Restructuring of W(111) Induced by Sulfur Overlayers
C.-H. Nien, I.M. Abdelrehim, and T.E. Madey, Rutgers University

 Surface Faceting of W(111) Induced by Ultrathin Films of Pd
C.-H. Nien and T.E. Madey, Rutgers University

 Chemical Selectivity in Scanning Tunneling Microscopy
Professor Kerry W. Hipps, Washington State University

 Scanning Tunneling Microscopy of Epitaxial Oxide Films
S. A. Joyce, Battelle Pacific Northwest Laboratories

 Ultra-High Vacuum Scanning Tunneling Microscopy: Individual C60 Molecules on Si(100)
Xiaowei Yao, Richard K. Workman, Dong Chen, Dror Sarid, University of Arizona