Index of Papers
Kelvin Probe dataKelvin Probe Measurements in Assembling Ionic Interfaces via Soft-Landed Ions,
A. A. Tsekouras, M. J. Iedema, J. P. Cowin, Pacific Northwest National Laboratory
G.B. Ellison, Department of Chemistry & Biochemistry, University of Colorado![]()
Changes in Work Function on Pt(111),
David Sauer and Eric M. Stuve, University of WashingtonReal-Time Work Function Change Measurements During Surface Reactions,
Michael X. Yang, Andrew V. Teplyakov, Phillip W. Kash and Brian E. Bent, Columbia UniversityOn the Elimination of Spacing Dependent Errors in the Kelvin Probe,
Van L. Eden and Robert C. McAllister, McAllister Technical ServicesA simple proceedure for adjusting the balance in the KP preamplifier.
Low temperature metal deposition processes for optoelectronic devices
Larry N. Lewis, Kevin H. Janora, Jie Liu, Shellie Gasaway, & Eric P. Jacobson
GE Global ResearchScanning Tunneling Microscope data from various users:
A Scanning Tunneling Microscopy and Spectroscopy Study of Vanadyl Phthalocyanine on Au(111)
D. Barlow and KW Hipps, Washing State University![]()
Surface Restructuring of W(111) Induced by Sulfur Overlayers
C.-H. Nien, I.M. Abdelrehim, and T.E. Madey, Rutgers UniversitySurface Faceting of W(111) Induced by Ultrathin Films of Pd
C.-H. Nien and T.E. Madey, Rutgers UniversityChemical Selectivity in Scanning Tunneling Microscopy
Professor Kerry W. Hipps, Washington State UniversityScanning Tunneling Microscopy of Epitaxial Oxide Films
S. A. Joyce, Battelle Pacific Northwest LaboratoriesUltra-High Vacuum Scanning Tunneling Microscopy: Individual C60 Molecules on Si(100)
Xiaowei Yao, Richard K. Workman, Dong Chen, Dror Sarid, University of Arizona
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Last Updated: 21 January 2002