Digital Kelvin Probe (Page 3)

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PRACTICAL APPLICATIONS for the Kelvin Probe System
Work function topographies Film thickness measurement Surface photovoltage spectroscopy Adsorption kinetics Surface stress measurements Sputter profiles Surface inhomogeneity Sample height topography Most surface-related phenomena

ADSORPTION MEASUREMENTS

• Atoms
• Ions
• Molecules
• Photons

MECHANICAL MEASUREMENTS

• Phase Transitions
• Stress
• Surface and Interface Defects
• Height Profiles

MENU-DRIVEN SOFTWARE
 

• Completely integrated software is included with the system. The MS Windows measuring and analysis program allows the operator to find the optimum signal-to-noise ratio by complete, independent control of amplitude, frequency of operation and probe-to-sample distance.
• The automatic tracking system senses and compensates for sample position variations due to thermal drift or mechanical disturbances.
• The optional automatic set-up mode uses an optional stepper motor-driven translator to move the probe to the correct distance from the sample. Please contact the factory with your system requirements for specific details.
• Minimum computer system requirements are an 80486 IBM-PC or 100% compatible computer running MS Windows 3.1 or higher, a hard disk, a math co-processor, 8Mb RAM and a VGA color monitor.

 

 

EXPANDABLE ELECTRONICS

• The rack-mounted electronics include three additional user-assignable input channels which can be used to monitor other processes such as pressure and temperature either in conjunction with, or independently from work function measurements.

 

 

CALL FOR MORE INFORMATION

• To find out more about how the Digital Kelvin Probe System can serve your needs as a viable and less expensive alternative, call, email or fax us today.

LORD KELVIN'S ORIGINAL APPARATUS The Kelvin method was first postulated by the renowned Scottish scientist William Thompson, Lord Kelvin, in 1898.

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